Exchange bias effects in submicron antiferromagnetic-ferromagnetic dots prepared by nanosphere lithography, Sort, J., Glaczynska, H., Ebels, U., Dieny, B., Giersig, M., Rybczynski, J., Journal of Applied Physics, 95, 7516 (2004)
Exchange bias effects in submicron antiferromagnetic-ferromagnetic dots prepared by nanosphere lithography, Sort, J., Glaczynska, H., Ebels, U., Dieny, B., Giersig, M., Rybczynski, J., Journal of Applied Physics, 95, 7516 (2004)
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