Exchange bias effects in submicron antiferromagnetic-ferromagnetic dots prepared by nanosphere lithography

Exchange bias effects in submicron antiferromagnetic-ferromagnetic dots prepared by nanosphere lithography, Sort, J., Glaczynska, H., Ebels, U., Dieny, B., Giersig, M., Rybczynski, J., Journal of Applied Physics, 95, 7516 (2004)


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