Characterization of electrical and crystallographic properties of metal layers at deca-nanometer scale using Kelvin probe force microscope, Gaillard, N., Mariolle, D., Bertin, F., Gros-Jean, M., Proust, M., Bsiesy, A., Bajolet, A., Chun, S., Djebbouri, M., 83, 2169 (2006)