Exchange bias effects in Fe nanoparticles embedded in an antiferromagnetic Cr, Sort, J., Langlais, V., Doppiu, S., Dieny, B., Surinach, S., Munoz, J.S., Baró, M.D., Laurent, C., Noguès, J., Nanotechnology, 15, S211 (2004)

Exchange bias effects in submicron antiferromagnetic-ferromagnetic dots prepared by nanosphere lithography, Sort, J., Glaczynska, H., Ebels, U., Dieny, B., Giersig, M., Rybczynski, J., Journal of Applied Physics, 95, 7516 (2004)

Enhancement of exchange bias through a non-magnetic spacer, Sort, J., Garcia, F., Rodmacq, B., Auffret, S., Dieny, B., Journal of Magnetism and Magnetic Materials, 272-276, 355 (2004)

Thermally-assisted switching in exchange-biased storage layer magnetic tunnel junctions, Prejbeanu, I.L., Kula, W., Ounadjela, K., Sousa, R.C., Redon, O., Dieny, B., Nozières, J.-P., IEEE Transactions on Magnetics, 40, 2625 (2004)

Correlated vortex chiralities in interacting permalloy dot patterns, Natali, M., Popa, A., Ebels, U., Chen, Y., Li, S., Welland, M.E., Journal of Applied Physics, 96, 4334 (2004)

Spin transfer effect in spin valve pillars for current-perpendicular-to-plane magnetoresistive heads, Lee, K.J., Liu, Y., Deac, A., Li, M., Chang, J.W., Liao, S., Ju, K., Redon, O., Dieny, B., Nozières, J.-P., Journal of Applied Physics, 95, 7423 (2004)

Fabrication of submicron magnetic line arrays for magnetic force microscopy tip calibration, Landis, S., Rodmacq, B., Dieny, B., 73-74, 790 (2004)

Fabrication and characterization of magnetic media deposited on top or side-edges of silicon dots, Landis, S., Rodmacq, B., Bayle-Guillemaud, P., Baltz, V., Dieny, B., 43, 3790 (2004)

Frequency domain studies of CoZr continuous thin films and FeNi wires using coplanar transmission lines, Kerekes, M., da Cas Viegas, A., Stanescu, D., Ebels, U., Xavier, P., Suran, G., Journal of Applied Physics, 95, 6616 (2004)

Boundary element method and micromagnetism coupling for magneto-resistive heads modeling, Firastrau, I., Buda-Prejbeanu, L.D., Toussaint, J.-C., Nozières, J.-P., Journal of Magnetism and Magnetic Materials, 272-276, 738 (2004)