Increase in ferromagnetic/antiferromagnetic exchange bias due to a reduction of the interfacial exchange interaction, Ernult, F., Dieny, B., Billard, L., Lançon, F., Regnard, J.-R., Journal of Applied Physics, 94, 6678 (2003)

A comparison of surface segregation for two semi-Heusler alloys: TiCoSb and NiMnSb, Caruso, A.N., Borca, C.N., Ristoiu, D., Nozières, J.-P., Dowben, P.A., Surface Science, 525, L109 (2003)

Field-dependent exchange coupling in NiO/Co bilayers, Camarero, J., Pennec, Y., Vogel, J., Pizzini, S., Cartier, M., Fettar, F., Ernult, F., Tagliaferri, A., Brookes, N.B., Dieny, B., Physical Review B, 67, 020413 (2003)

Perpendicular interlayer coupling in Ni, Camarero, J., Pennec, Y., Vogel, J., Bonfim, M., Pizzini, S., Ernult, F., Fettar, F., Garcia, F., Lançon, F., Billard, L., Dieny, B., Tagliaferri, A., Brookes, N.B., Physical Review Letters, 91, 027201 (2003)

Modeling of spin-dependent hot-electron transport in the spin valve transistor, Vlutters, R., van’t Erve, O.M.J., Jansen, R., Kim, S.D., Lodder, J.C., Vedyaev, A., Dieny, B., Physical Review B, 65, 024416 (2002)

Interpretation of the magnetoresistance in doped magnetic tunnel junctions, Vedyaev, A., Vlutters, R., Ryzhanova, N., Lodder, J.C., Dieny, B., European Physical Journal B, 25, 5 (2002)

Crossover from in-plane to perpendicular anisotropy in Pt/CoFe/AlO, Monso, S., Rodmacq, B., Auffret, S., Casali, G., Fettar, F., Gilles, B., Dieny, B., Boyer, P., Applied Physics Letters, 80, 4157 (2002)

Modeling of the current lines in discontinuous metal/insulator multilayers, Ernult, F., Giacomoni, L., Marty, A., Dieny, B., Vedyaev, A., Ryzhanova, N., European Physical Journal B, 25, 177 (2002)

Influence of deposition angle on the properties of NiO spin valves, Cartier, M., Auffret, S., Bayle-Guillemaud, P., Ernult, F., Fettar, F., Dieny, B., Journal of Applied Physics, 91, 1436 (2002)

Influence of s-d interfacial scattering on the magnetoresistance of magnetic tunnel junctions, Bagrets, D., Bagrets, A., Vedyaev, A., Dieny, B., Physical Review B, 65, 064430 (2002)