Vortex-antivortex-assisted magnetization dynamics in a semi-continuous thin-film model system studied by micromagnetic simulations, Kim, S.K., Lee, K.S., Kang, B.W., Lee, K.J., Kortright, J.B., Applied Physics Letters, 86, 052504 (2005)

Diode effect in magnetic tunnel junctions with impurities, Kanjouri, F., Ryzhanova, N., Strelkov, N., Vedyaev, A., Dieny, B., Journal of Applied Physics, 98, 083901 (2005)

Spintronics – Foreword, Fert, A., Nozières, J.-P., Comptes Rendus de Physique, 6, 919 (2005)

Structural and electrical characterizations of yttrium oxide films after post-annealing treatments, Durand, C., Dubourdieu, C., Vallée, C., Gautier, E., Ducroquet, F., Jalabert, D., Roussel, H., Bonvalot, M., Joubert, O., Journal of the Electrochemical Society, 152, F217 (2005)

Electrochemical control and selection of the structural and magnetic properties of cobalt nanowires, Darques, M., Piraux, L., Encinas, A., Bayle-Guillemaud, P., Popa, A., Ebels, U., Applied Physics Letters, 86, 072508 (2005)

Study of the electronic paraprocess and antiphase boundaries as sources of the demagnetisation phenomenon in magnetite, Ciorcas-Delille, F., Dieny, B., Moussy, J.-B., Guittet, M.-J., Gota, S., Gautier-Soyer, M., Marin, C., Journal of Magnetism and Magnetic Materials, 294, 27 (2005)

Origin of the asymmetric magnetization reversal behavior in exchange-biased systems: Competing anisotropies, Camarero, J., Sort, J., Hoffmann, A., García Martín, J.M., Dieny, B., Miranda, R., Noguès, J., Physical Review Letters, 95, 057204 (2005)

Spin injection into semiconductors: Towards a semiconductor-based spintronic device, Bsiesy, A., Comptes Rendus de Physique, 6, 1022 (2005)

Exploiting length scales of exchange bias systems to fully tailor double-shifted hysteresis loops, Brück, S., Sort, J., Baltz, V., Surinach, S., Munoz, J.S., Dieny, B., Baró, M.D., Noguès, J., 17, 2978 (2005)

Thermal activation effects on the exchange bias in ferromagnetic-antiferromagnetic nanostructures, Baltz, V., Sort, J., Rodmacq, B., Dieny, B., Landis, S., Physical Review B, 72, 104419 (2005)