JOURNAL ARTICLES




New RF magnetic stripe inductors with flanges based on exchange-coupled magnetic films, Michel, J.-P., Lamy, Y., Royet, A.S., Viala, B., IEEE Transactions on Magnetics, 42, 3368 (2006)

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Interpretation of relationship between current-perpendicular-to-plane magnetoresistance and spin torque amplitude, Manchon, A., Strelkov, N., Deac, A., Vedyaev, A., Dieny, B., Physical Review B, 73, 184418 (2006)

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Generalization of a circuit theory for current-perpendicular-to-plane magnetoresistance and current-driven torque, Manchon, A., Slonczewski, J.C., Physical Review B, 73, 184419 (2006)

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Micromagnetic investigation of the dynamics of magnetization switching induced by a spin-polarized current, Lee, K.J., Dieny, B., Applied Physics Letters, 88, 132506 (2006)

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NiMn, IrMn, and NiO exchange-coupled CoFe multilayers for microwave applications, Lamy, Y., Viala, B., IEEE Transactions on Magnetics, 42, 3332 (2006)

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Magnetic relaxation of exchange-biased Pt/Co multilayers studied by time-resolved Kerr microscopy, Romanens, F., Pizzini, S., Yokaichiya, F., Bonfim, M., Pennec, Y., Camarero, J., Vogel, J., Sort, J., Garcia, F., Rodmacq, B., Dieny, B., Physical Review B, 72, 134410 (2005)

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Tailoring size effects on the exchange bias of sub-100nm ferromagnetic-antiferromagnetic nanostructures, Baltz, V., Sort, J., Landis, S., Rodmacq, B., Dieny, B., Physical Review Letters, 94, 117201 (2005)

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Magnetic relaxation measurements of exchange-biased (Pt/Co) multilayers with perpendicular anisotropy, Romanens, F., Pizzini, S., Sort, J., Garcia, F., Camarero, J., Yokaichiya, F., Pennec, Y., Vogel, J., Dieny, B., European Physical Journal B, 45, 185 (2005)

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EPR investigation of manganese ions in 70TeO, Ardelean, I., Peteanu, M., Muresan, N., Ioncu, V., Ciorcas-Delille, F., 7, 2661 (2005)

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Exchange bias in ferromagnetic nanoparticies embedded in an antiferromagnetic matrix, Noguès, J., Sort, J., Langlais, V., Doppiu, S., Dieny, B., Munoz, J.S., Surinach, S., Baró, M.D., Stoyanov, S., Zhang, Y., International Journal of Nanotechnology, 2, 23 (2005)

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