Local current measurements of an insulating layer using an UHV atomic force microscope in contact mode (January 01st, 2002)
Local current measurements of an insulating layer using an UHV atomic force microscope in contact mode, Gilles, B., Fettar, F., Pillet, J.-C., Marty, A., Ernult, F., Monso, S., Dieny, B., Journal of Magnetism and Magnetic Materials, 242-245, 1261 (2002)
Read moreExchange bias with perpendicular anisotropy in (Pt-Co)(n)-FeMn multilayers (January 01st, 2002)
Exchange bias with perpendicular anisotropy in (Pt-Co)(n)-FeMn multilayers, Garcia, F., Moritz, J., Ernult, F., Auffret, S., Rodmacq, B., Dieny, B., Camarero, J., Pennec, Y., Pizzini, S., Vogel, J., IEEE Transactions on Magnetics, 38, 2730 (2002)
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