Method to assess the grain crystallographic orientation with a submicronic spatial resolution using Kelvin probe force microscope

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Spintec > JOURNAL ARTICLES > Method to assess the grain crystallographic orientation with a submicronic spatial resolution using Kelvin probe force microscope

JOURNAL ARTICLES

Method to assess the grain crystallographic orientation with a submicronic spatial resolution using Kelvin probe force microscope, Gaillard, N., Gros-Jean, M., Mariolle, D., Bertin, F., Bsiesy, A., Applied Physics Letters, 89, 154101 (2006)